Exponentially Enhanced Quantum Metrology

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Exponentially enhanced quantum metrology.

We show that when a suitable entanglement-generating unitary operator depending on a parameter is applied on N qubits in parallel, a precision of the order of 2(-N) in estimating the parameter may be achieved. This exponentially improves the precision achievable in classical and in quantum nonentangling strategies.

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ژورنال

عنوان ژورنال: Physical Review Letters

سال: 2008

ISSN: 0031-9007,1079-7114

DOI: 10.1103/physrevlett.100.220501